Facilities

Semiconductor and Nanostructures Epitaxy:

Materials/Devices Characterization and Processing:

	2. LCR Meter (Agilent 4284A)

		4. Photoluminescence and Electroluminescence
3. Photocurrent Spectroscopy

	6. Hybond 572A Wedge wire bonder

Other materials and devices characterization capability available in UCR:

1) Analytical Microscopy User Facility, including SEM and TEM

2) UCR Optical User Facility, including XRD, FTIR, Raman Spectroscopy, Scanning UV/VIS/IR Spectrophotometer, etc.

Device Fabrication:

1. UCR Clean Room

2. UCLA Nanofabrication User Facility

3. Stanford Nanofabrication Facility